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Volumn 20, Issue 3, 2005, Pages 64-69
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Research on threshold of early prediction for short circuit fault based on wavelet transform
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Author keywords
Early prediction; Short circuit fault; Threshold; Wavelet transform
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Indexed keywords
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EID: 25844500830
PISSN: 10006753
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (6)
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References (5)
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