High-throughput x-ray characterization system for combinatorial materials studies

Review of Scientific Instruments

Volumn 76, Issue 9, 2005, Pages

  Luo, Zhenlin ^a   Geng, Bin ^a   Bao, Jun ^a   Liu, Cihui ^a   Liu, Wenhan ^a   Gao, Chen ^a   Liu, Zhiguo ^b   Ding, Xunliang ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b BEIJING NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-THROUGHPUT X-RAY CHARACTERIZATION; X-RAY FLUORESCENCE; X-RAY SCINTILLATION; X-RAY SOURCES;

COMPUTER SOFTWARE; ENERGY DISPERSIVE SPECTROSCOPY; FIBER OPTICS; FLUORESCENCE; PHOTOLUMINESCENCE; SCINTILLATION; SPECTROMETERS; THROUGHPUT; X RAY DIFFRACTION;

X RAY ANALYSIS;

EID: 25844490476     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2038147     Document Type: Article

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