"Sub-hertz" dielectric spectroscopy

Proceedings of the International Symposium on Electrical Insulating Materials

Volumn 3, Issue , 2005, Pages 821-824

  Fothergill, J C ^a   See, K B A ^b   Ajour, M N ^c   Dissado, L A ^a  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

^b MONASH UNIVERSITY MALAYSIA   (Malaysia)

^c PHILADELPHIA UNIVERSITY   (Jordan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MATERIALS; DELAMINATION; ELECTRIC CABLES; ELECTRIC CONDUCTANCE; FAILURE (MECHANICAL); POLYETHYLENES; SPECTROSCOPIC ANALYSIS;

DIELECTRIC SPECTROSCOPY; EPOXY COMPOSITES; PERCOLATION; THERMO-ELECTRIC AGEING;

DIELECTRIC DEVICES;

EID: 25644453653     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iseim.2005.193505     Document Type: Conference Paper

References (8)

1. L.A. Dissado and R.M. Hill, "Anomalous low frequency dispersion. A near DC conductivity in disordered low dimensional materials", J. Chem. Soc. Faraday Trans. 2, 80, 291-319, 1984.
2. A. K. Jonscher, Universal Relaxation Law, Chelsea Dielectrics Press, 1996
3. L. A. Dissado and R. M. Hill, "Constant-phase angle and power-law regimes in the frequency response of a general determinate fractal circuit", Phys. Rev. B, 37(7), 3434-3439, 1988
4. e.g. M. C. Lee and N. A. Peppas, "Water Transport In Epoxy-Resins", Progress in Poly. Sci., 18(5), 947-961, 1993
5. R. C. Allen, "Some Corrosion Mechanisms in Attack of Resin and Resin-Glass Laminates", Polymer Engineering and Science, 5, 329-336, 1979
6. H. Janssen, J. M. Seifert and H. C. Kärner, "Interfacial Phenomena in Composite High Voltage Insulation", IEEE Trans. DEI, 6(5), 651-659, 1999
7. R. Comrie, S. Affrossman, D. Hayward and R. A. Pethrick, "Nondestructive Examination Of Epoxy Adhesive-Bonded Structures Exposed To A Humid Environment: A Comparison of Low- and High-Frequency Dielectric Measurements", The Journal of Adhesion, 78:967-985, 2002
8. J. K. Nelson, J. C. Fothergill, L. A. Dissado and W. Peasgood, "Towards an understanding of nanometric dielectrics", Ann. Rep. CEIDP (IEEE Pub. 02CH37372), 295-298, 2002