Influence of ion chamber response on in-air profile measurements in megavoltage photon beams

Medical Physics

Volumn 32, Issue 9, 2005, Pages 2918-2927

  Tonkopi, E ^a,b   McEwen, M R ^a   Walters, B R B ^a   Kawrakow, I ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

^b CARLETON UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION CHAMBERS; PARTICLE BEAMS; PHOTOELECTRONS; PHOTONS; UNCERTAINTY ANALYSIS;

AIR KERMA MEASUREMENTS; CENTRAL AXIS; HIGH-Z MATERIAL; MEGAVOLTAGE PHOTONS; OFF-AXIS RATIOS; PHOTON BEAMS; PROFILE MEASUREMENT; SIMULATION UNCERTAINTY;

MONTE CARLO METHODS;

ACCURACY; ARTICLE; COMPARATIVE STUDY; IONIZATION CHAMBER; MEGAVOLTAGE RADIATION; MONTE CARLO METHOD; PHANTOM; PHOTON; PRIORITY JOURNAL; RADIATION BEAM; RADIATION MEASUREMENT; TECHNIQUE;

EID: 25644452873     PISSN: 00942405     EISSN: None     Source Type: Journal    
DOI: 10.1118/1.2011090     Document Type: Article

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