Structural characterization of CVD diamond films using Raman and ESR spectroscopy methods

Optical Materials

Volumn 28, Issue 1-2, 2006, Pages 106-110

  Fabisiak, K ^a,b   Banaszak, A ^a   Kaczmarski, M ^c   Kozanecki, M ^d  

^a KAZIMIERZ WIELKI UNIVERSITY   (Poland)

^b NICOLAUS COPERNICUS UNIVERSITY   (Poland)

^c ADAM MICKIEWICZ UNIVERSITY   (Poland)

^d LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Diamond film; ESR; Hot Filament CVD; Raman spectroscopy; SEM

Indexed keywords

ACETYLENE; CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; ELECTRON SPIN RESONANCE SPECTROSCOPY; MIXTURES; MORPHOLOGY; PRESSURE EFFECTS; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL);

FILM QUALITY; GAS PRESSURE; HOT FILAMENT CHEMICAL VAPOR DEPOSITION (HF CVD);

DIAMOND FILMS;

EID: 25644445412     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2004.11.057     Document Type: Conference Paper

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