Study the percolation phenomenon of high field volt-ampere characteristic in the composite of low-density polyethylene / nano-SiOx

Proceedings of the International Symposium on Electrical Insulating Materials

Volumn 1, Issue , 2005, Pages 243-246

  Chen, Jiong ^a   Yin, Yi ^a   Li, Zhe ^a   Xiao, Dengming ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC MECHANICAL ANALYSIS; GLASS TRANSITION; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PERCOLATION (FLUIDS); SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

DOUBLE-SOLUTION MIXTURES; MECHANICAL LOSS; STORAGE MODULUS;

LOW DENSITY POLYETHYLENES;

EID: 25644441778     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Min Zhi Rong, Ming Qiu Zhang, Yong Xiang Zheng, Han Min Zeng, K. Friedrich. Polymer 42 (2001): 3301
2. Guohua Chen, Wengui Weng, Dajun Wu, Cuiling Wu. European Polymer Journal 39 (2003): 2329
3. S.A. Zavyalov, A.N. Pivkina, J. Schoonman. Solid State Ionics 147 (2002): 415
4. Jiong Chen, Yi Yin, Zhe Li, Dengming Xiao. Jpn. J. Appl. Phys. (to be published in JJAP).
5. Jiong Chen, Yi Yin, Zhe Li, Dengming Xiao. Jpn. J. Appl. Phys. (another paper to be published in JJAP)