Characterization of sensor performance and durability for Structural Health Monitoring systems

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5770, Issue , 2005, Pages 66-75

  Blackshire, James L ^a   Giurgiutiu, Victor ^b   Cooney, Adam ^a   Doane, James ^b  

^a AIR FORCE RESEARCH LABORATORY   (United States)

^b University of South Carolina   (United States)

Author keywords

Displacement Field imaging; Piezo Wafer Active Sensors; Structural Health Monitoring

Indexed keywords

DISPLACEMENT-FIELD IMAGING; PIEZO WAFER ACTIVE SYSTEMS; STRUCTURAL HEALTH MONITORING;

IMAGING TECHNIQUES; MOISTURE; PERFORMANCE; SENSORS; VIBRATIONS (MECHANICAL);

HEALTH CARE;

EID: 25644440091     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.599888     Document Type: Conference Paper

References (16)

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