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Volumn 1, Issue , 2005, Pages 99-102

Investigating charge trapping properties of combinations of XLPE and semiconductive materials in plaques and cable models

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRIC SPACE CHARGE; ELECTRON TRAPS; INSULATING MATERIALS; POLYMERS;

EID: 25644432853     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iseim.2005.193338     Document Type: Conference Paper
Times cited : (12)

References (3)
  • 1
    • 0033716642 scopus 로고    scopus 로고
    • The electrical degradation threshold of polyethylene investigated by space charge and conduction current measurements
    • June
    • G.C. Montanari, "The electrical degradation threshold of polyethylene investigated by space charge and conduction current measurements", IEEE Trans. on DEI, Vol. 7, n. 3, pp. 309-315, June 2000.
    • (2000) IEEE Trans. on DEI , vol.7 , Issue.3 , pp. 309-315
    • Montanari, G.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.