Resonant inelastic soft-X-ray scattering at the 4d edge of Ce-based heavy-fermion materials

Journal of Electron Spectroscopy and Related Phenomena

Volumn 101-103, Issue , 1999, Pages 783-786

  Butorin, S M ^a,d   Magnuson, M ^a   Ivanov, K ^b   Shuh, D K ^b   Takahashi, T ^c   Kunii, S ^c   Guo, J H ^a   Nordgren, J ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c TOHOKU UNIVERSITY   (Japan)

^d INSTITUTE OF METAL PHYSICS   (Russian Federation)

Author keywords

Ce based heavy fermion systems; Charge transfer excitations; Resonant soft X ray scattering; X ray absorption

Indexed keywords

EID: 25544456008     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(98)00369-7     Document Type: Article

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