Dual EMAT and PEC non-contact probe: Applications to defect testing

NDT and E International

Volumn 39, Issue 1, 2006, Pages 45-52

  Edwards, R S ^a   Sophian, A ^b   Dixon, S ^a   Tian, G Y ^b   Jian, X ^a  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b UNIVERSITY OF HUDDERSFIELD   (United Kingdom)

Author keywords

Defect detection; Eddy current NDT; EMAT; Sensor fusion; Ultrasound

Indexed keywords

CALIBRATION; CRYSTAL DEFECTS; EDDY CURRENTS; NONDESTRUCTIVE EXAMINATION; SENSOR DATA FUSION; ULTRASONICS;

DEFECT DETECTION; EDDY CURRENT NONDESTRUCTIVE EXAMINATION; ELECTROMAGNETIC ACOUSTIC TRANSDUCERS (EMAT); SENSOR FUSION;

PROBES;

EID: 25444526338     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ndteint.2005.06.001     Document Type: Article

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