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Volumn 426-431, Issue II, 2005, Pages 1479-1483

Detailed characterization for YBCO intrinsic Josephson junctions by using small-sized junctions

Author keywords

FIB etching; Intrinsic Josephson junctions; Whisker; YBa2Cu3O7 X

Indexed keywords

ANISOTROPY; CRITICAL CURRENTS; CURRENT DENSITY; ETCHING; GRAIN BOUNDARIES; ION BEAMS; JOSEPHSON JUNCTION DEVICES;

EID: 25444522917     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physc.2005.01.072     Document Type: Article
Times cited : (8)

References (20)
  • 13
    • 25444472738 scopus 로고    scopus 로고
    • Ph.D. thesis, Tohoku University, Japan
    • Y. Uematsu, Ph.D. thesis, Tohoku University, Japan, 2001.
    • (2001)
    • Uematsu, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.