Photo-induced valence-number changes and defects in Eu2O 3 fine particle films

Journal of Physics: Conference Series

Volumn 21, Issue 1, 2005, Pages 189-194

  Mochizuki, Shosuke ^a   Fujishiro, Fumito ^a   Ishiwata, Ken'ichiro ^a  

^a NIHON UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 25444521956     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/21/1/031     Document Type: Conference Paper

References (12)

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