Electrical properties of Si-SiO2-Si nanogaps

Nanotechnology

Volumn 16, Issue 10, 2005, Pages 2197-2202

  Berg, Jonas ^a   Che, Franklin ^a   Lundgren, Per ^a   Enoksson, Peter ^a   Bengtsson, Stefan ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; ELECTRIC POTENTIAL; ELECTRIC PROPERTIES; ELECTRODES; LEAKAGE CURRENTS; MOLECULES; NANOTECHNOLOGY; PHASE SEPARATION;

CURRENT INSTABILITIES; ELECTRODE STRUCTURES; NANOGAPS; SILICON ELECTRODES;

SILICA;

EID: 25444510093     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/10/037     Document Type: Article

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