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Coleby, D.E.1
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84986176501
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The Development and validation of a new technique to compare complex data sets
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15th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, 18-20 February
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Coleby, D.E. and Duffy, A.P. (2003), “The Development and validation of a new technique to compare complex data sets”, 15th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, 18-20 February, pp 123-6.
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The use of pilot rating in the evaluation of aircraft handling qualities
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AGARD Report 567, April, 1969
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The Wilcoxon signed rank test for paired data
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Lethan, J.1
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PhD, De Montfort University, Leicester.
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Quantitative data comparisons: applications and experiences in automotive EMC
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15th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, 18-20, February, 2003
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Ruddle, A., Martin, A. and Ward, D. (2003), “Quantitative data comparisons: applications and experiences in automotive EMC”, 15th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, 18-20, February 2003, pp. 111-16.
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84986161704
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Ensuring performance of computer based data comparison algorithms for complex EMC data
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EMC Europe 2002, International Symposium on Electromagnetic Compatibility, Sorrento, 9-13 September 2002, paper PD2.
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Simpson, R.J., Coleby, D.E., Duffy, A.P., Jones, C.C.R. and MacDiarmid, I.P. (2002), “Ensuring performance of computer based data comparison algorithms for complex EMC data”, EMC Europe 2002, International Symposium on Electromagnetic Compatibility, Sorrento, 9-13 September 2002, paper PD2.
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25444529035
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IELF (integrated error against log frequency) as a solution to quantifying comparisons
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15th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, 18-20 February, 2003
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Simpson, R.J. and Jones, C.C.R. (2003), “IELF (integrated error against log frequency) as a solution to quantifying comparisons”, 15th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, Zurich, 18-20 February 2003, pp. 119-22.
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