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Volumn 21, Issue 1, 2005, Pages 101-105
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Current status of 50-picosecond resolved x-ray diffraction at Photon Factory Advanced Ring (PF-AR)
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 25444482611
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/21/1/016 Document Type: Conference Paper |
Times cited : (2)
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References (5)
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