Analysis and reduction of ultrasonic pitting defects on hard disk surfaces

Materials and Manufacturing Processes

Volumn 20, Issue 5, 2005, Pages 851-861

  Zhong, Z W ^a   Gee, S H ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Cleaning; Defect location; Disk drive analyzer; Failure analysis; Film thickness; Hard disk; Kerr magneto effect; Magnetic pattern; Manufacturing; Material; Optical surface analyzer; Reduction; Surface; Ultrasonic pitting defect; Ultrasonic power

Indexed keywords

CHEMICAL CLEANING; ELECTRON TRANSITIONS; FAILURE ANALYSIS; HARD DISK STORAGE; MAGNETIC RECORDING; OPTICAL KERR EFFECT; PITTING; ULTRASONIC EFFECTS;

DISK DRIVE ANALYZER; FILM THICKNESS; KERR MAGNETO-EFFECT; MAGNETIC PATTERNS; OPTICAL SURFACE ANALYZER; ULTRASONIC PITTING DEFECTS; ULTRASONIC POWER;

CRYSTAL DEFECTS;

EID: 25444481405     PISSN: 10426914     EISSN: None     Source Type: Journal    
DOI: 10.1081/AMP-200060364     Document Type: Article

References (23)

1. Zhong, Z.W.; Zheng, Z. Flying height deviations in glide height tests. Sensors and actuators A: Physical 2003, 105 (3), 255-260.
2. Zhong, Z.W.; Zheng, Z. Head-disk interfacial behavior in glide tests for manufacturing hard disks. Materials and Manufacturing Processes 2003, 18 (1), 123-134.
3. Tarnopolsky, G.J. Hard disk drive capacity at high magnetic areal density. IEEE Transactions on Magnetics 2004, 40 (1), 301-306.
4. Sun, J.; Zhong, Z. Finite element analysis of a new PZT actuator for hard disk drives. Sensors and Actuators A: Physical 2002, 100, 257-263.
5. Jing, Y.; Luo, J.; Yi, X.; Gu, X. Design and evaluation of PZT thin-film micro-actuator for hard disk drives. Sensors and Actuators A: Physical 2004, 116, 329-335.
6. Kang, C.-I.; Baek, S.-E.; Shim, J.-S. A new seek servo controller for minimizing power consumption in micro hard disk drives. IEEE Transactions on Magnetics 2004, 40 (4), 3127-3129.
7. Johnson, K.E. Fabrication of low noise thin film media. In Noise in Digital Magnetic Recording; Arnoldussen, T., Nunnelly, L., Eds.; World Scientific publishers: Singapore, 1992; Vol. 12, 139-141.
8. Hajdu, J.; Yarkowky, F.; Suplicki, M. The electroless nickel process for memory disks. Proceedings of the Symposium on: Magnetic Materials, Processes and Devices, Romankiw, L., Herman, D., Eds.; 1990; Vol. 90-8, 685-686.
9. Xuan, J.; Chen, G. CDD Laser Texture Tsechnology Development; CDD Internal Report: San Diego, CA, 1995; 12-15.
10. Teng, E.; Eltouky, A.; Coughlin, T. Designing media with alternative substrate materials. Data Storage 1994, 3, 35-39.
11. Bertram, H. Fundamental magnetization process in thin film recording media. Solid State Physics - Advances in Research and Application; Ehrenreich, H., Turnbull, D., Eds.; Academic: San Diego, CA, 1992; Vol. 46, 271-273.
12. Aronson, A. The basic of sputtering equipment. In MRC Transactions of the Symposium on Thin Film Technology, Materials Research Corporation, 1991; Vol. A2, 1001-1011.
13. Sequeda, F. Thin film deposition techniques in microelectronics. Journal of Metals 1986, 2, 55-57.
14. Bhushan, B. Tribology and Mechanics of Magnetic Storage Devices; Springer-Verlag Publishers: New York, 1990; 30-35.
15. Freeman, I. Alternative substrates, a reason for change? In IDEMA Proceedings - Alternative Substrates, 1995; Vol. III, 131-133.
16. Glocker, D.; Shah, S. Handbook of Thin Film Process Technology; Institute of Physics Publishing: New York, 1998; 178-180.
17. Meeks, S.; Kudinar, R. The next battleground: head disk interface. Disk Storage Magazine 1998, 5, 29-38.
18. Meeks, S. A combined ellipsometer, reflectometer, scatterometer and Kerr effect microscope for thin film disk characterization. SPIE 2000, 5966, 385-392.
19. Meeks, S.; Weresin, W. Optical surface analysis of head disk interface of thin film disks. ASME Journal of Tribology 1995, 117, 112-118.
20. Boyd, M.; Xu, X. Surface characterization for computer disks, wafers, and flat panel displays. SPIE 3619, 53-54.
21. Yoneda, Y.; Arai, A.; Nishimoto, Y.; Nakai, Y. Development of automatic surface inspection system for magnetic disk substrates using a laser multi-sensing technique. J. Jap. Soc. Pre. Eng. 1990, 56, 479-484.
22. Brar, A.S.; Narayan, P.B. Surface analysis program for zero defects. Micro Manufacturing Testing 1989, 12, 73-74.
23. Schreck, E.; Lin, H. Magnetic signal distribution in disk drives. IEEE Transactions on Magnetics 1990, 35, 3980-3988.