Chemical sensitivity in positron annihilation with just one single Ge detector

Physica Status Solidi (A) Applications and Materials Science

Volumn 202, Issue 4, 2005, Pages

  Haaks, Matz ^a   Staab, Torsten E M ^a   Saarinen, Kimmo ^b   Maier, Karl ^a  

^a UNIVERSITY OF BONN   (Germany)

^b AALTO UNIVERSITY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH PURITY METALS; MOMENTUM DISTRIBUTIONS; POSITRON ANNIHILATION; POSITRON BEAM SYSTEM;

DATA ACQUISITION; DETECTORS; MATHEMATICAL MODELS; RADIATION EFFECTS;

GERMANIUM;

EID: 25444474971     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200510004     Document Type: Article

References (11)

1. A. Seeger, J. Phys. F 3, 248 (1973).
2. L. C. Smedskjær and M. J. Fluss, in: Methods of Experimental Physics, vol. 21, edited by R. Celotta and J. Levine (Academic Press, Orlando, 1983), chap. 2, p. 77.
3. K. G. Lynn, J. R. McDonald, R. A. Boie, L. C. Feldman, J. D. Gabbe, M. F. Robbins, E. Bonderup, and J. Golovchenko, Phys. Rev. Lett. 38, 241 (1977).
4. M. Alatalo, B. Barbiellini, M. Hakala, H. Kauppinen, T. Korhonen, M. J. Puska, K. Saarinen, P. Hautojärvi, and R. M. Nieminen, Phys. Rev. B 54, 2397 (1996).
5. V. Ghosh, Appl. Surf. Sci. 85, 187 (1995).
6. [61 W. Raudorf and H. Pehl, Nucl. Instrum. Methods A 255, 538 (1987).
7. R. G. Helmer and C. M. McCullagh, Nucl. Instrum. Methods 206, 477 (1982).
8. M. Haaks, T. E. M. Staab, and K. Maier, in preparation.
9. A. Dupasquier, G. Kögel, and A. Somoza, Acta Mater. 52, 4707 (2004).
10. H. Greif, M. Haaks, U. Holzwarth, U. Männig, M. Tongbhoyai, T. Wider, K. Maier, H. Bihr, and B. Huber, Appl. Phys. Lett. 15, 2115 (1997).
11. K. Bennewitz, M. Haaks, T. Staab, S. Eisenberg, Th. Lampe, and K. Maier, Z. Met.kd 93, 778 (2002).