Simultaneous total variation image inpainting and blind deconvolution

International Journal of Imaging Systems and Technology

Volumn 15, Issue 1, 2005, Pages 92-102

  Chan, Tony F ^a   Yip, Andy M ^a   Park, Frederick E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Blind deconvolution; Deblur; Image inpainting; Simultaneous model; Total variation

Indexed keywords

BLIND DECONVOLUTION; DEBLUR; IMAGE INPAINTING; SIMULTANEOUS MODEL; TOTAL VARIATION;

BOUNDARY CONDITIONS; ERROR ANALYSIS; MATHEMATICAL MODELS; PROBLEM SOLVING;

IMAGE ANALYSIS;

EID: 25444446893     PISSN: 08999457     EISSN: None     Source Type: Journal    
DOI: 10.1002/ima.20041     Document Type: Article

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