Chemical alteration of poly(tetrafluoroethylene) TFE Teflon induced by exposure to electrons and inert-gas ions

Journal of Physical Chemistry B

Volumn 109, Issue 35, 2005, Pages 16676-16683

  Everett, Michael L ^a   Hoflund, Gar B ^a  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC OXYGEN (AO); ION FLUXES; STEADY-STATE; VACUUM ULTRAVIOLET (UAV) RADIATION;

CARBON; CHEMISORPTION; ELECTRON GAS; EROSION; INERT GASES; ULTRAVIOLET RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

POLYTETRAFLUOROETHYLENES;

EID: 25444436276     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp051430k     Document Type: Article

References (41)

1. FEP Teflon, TFE Teflon, Tefzel, Tedlar, and Kapton are registered trademark names by E.I. duPont Nemours & Co., Inc.
2. Banks, B. A. In The Use of Fluoropolymers in Space Applications. Modern Fluoropolymers; John Wiley & Sons: New York, 1997.
3. Leger L. J.; Visentine, J. T. J. Spacecr. Rockets 1986, 23, 505.
4. Koontz, S. L.; Leger, L. J.; Visentine, J. T.; Hunton, D. E.; Cross, J. B.; Hakes, C. L. J. Spacecr. Rockets 1995, 32, 483.
5. Tennyson, R. C. Can. J. Phys. 1991, 69, 1190.
6. Koontz, S. L.; Leger, L. J.; Rickman, S. L.; Hakes, C. L.; Bui, D. T.; Hunton, D. E.; Cross, J. B. J. Spacecr. Rockets 1995, 32, 475.
7. Reddy, M. R. J. Mater. Sci. 1995, 30, 281.
8. Packirisamy, S.; Schwam, D.; Litt, M. H. J. Mater. Sci. 1995, 30, 308.
9. Reddy, M. R.; Srinivasamurthy, N.; Agrawal, B. L. Eur. Space Agency J. 1992, 16, 193.
10. de Groh, K. K.; Banks, B. A. J. Spacecr. Rockets 1994, 31, 656.
11. Grossman, E.; Lifshitz, Y.; Wolan, J. T.; Mount, C. K.; Hoflund, G. B. J. Spacecr. Rockets 1999, 36, 15.
12. DeGroh, K. K.; Gaier, J. R.; Espe, M. P.; Cato, D. R.; Sutter, J. K.; Scheiman, D. A. High Perform. Polym. 2000, 12, 83.
13. Dever, J. A.; DeGroh, K. K.; Banks, B. A.; Townsend, J. A.; Barth, J. L.; Thomson, S.; Gregory, T.; Savage, W. High Perform. Polym. 2000, 12, 125.
14. Rasoul, F. A.; Hill, D. J. T.; Forsythe, J. S.; O'Donnell, J. H.; George, G. A.; Pomery, P. J.; Young, P. R.; Connell, J. W. J. Appl. Polym. Sci. 1995, 58, 1857.
15. de Groh, K. K.; Martin, M. J. Spacecr. Rockets 2004, 41, 366.
16. Hoflund, G. B.; Everett, M. L. J. Phys. Chem. B 2004, 108, 15721.
17. Everett, M. L.; Hoflund, G. B. J. Polym. Sci. 2004, 43, 552.
18. Wolan, J. T.; Hoflund, G. B. J. Vac. Sci. Technol. A 1999, 17, 662.
19. Phillips, S. H.; Gonzalez, R. I.; Chaffee, K. P.; Haddad, T. S.; Hoflund, G. B.; Hsiao, B. S.; Fu, B. X. Proceedings of the 45th International SAMPE Symposium; Ruth, S., Lee, C., Eds.; Technamic Publishing Co., Inc.: Lancaster, PA, 2000; Vol. 45, p 1921.
20. Gonzalez, R. I.; Phillips, S. H.; Hoflund, G. B. J. Spacecr. Rockets 2000, 37, 463.
21. Hoflund, G. B.; Gonzalez, R. I.; Phillips, S. H. J. Adhesion Sci. Technol. 2001, 15, 1199.
22. Pruden, K. G.; Sinclair, K.; Beaudoin, S. J. Polym. Sci. A 2003, 41, 1486.
23. Shyichuk, A.; Melnyk, D.; White, J. R. J. Polym. Sci. A 2003, 41, 1070.
24. Nagata, M.; Hizakae, S. J. Polym. Sci. A 2003, 41, 2930.
25. Hsiao, S.-H.; Chen, W.-T. J. Polym. Sci. A 2003, 41, 420.
26. Gelin, M.-P.; Ameduri, B. J. Polym. Sci. A 2003, 41, 160.
27. Hsiao, S.-H.; Yang, C.-P.; Chung, C.-L. J. Polym. Sci. A 2003, 41, 2001.
28. Lu, Z.; Cheng, L.; Li, J.; Zhang, K.; Yi, S.; Qin, J. J. Polym. Sci. 2004, 42, 925
29. Furukawa, Y.; Yoneda, T. J. Polym. Sci. A 2003, 41, 2704.
30. Fujiwara, H.; Narita, T.; Hamana, H. J. Polym. Sci. 2003, 41, 2743.
31. Zuev, V. V.; Skvortsov, N. K. J. Polym. Sci. A 2003, 41, 3761.
32. Liu, Y.-L.; Wu, C.-S.; Chiu, Y.-S.; Ho, W.-H. J. Polym. Sci. A 2003, 41, 2354.
33. Hoffmann, E. A.; Fekate, Z. A.; Korugic-Karasz, L. S.; Karasz, F. E. J. Polym. Sci. A 2004, 42, 551.
34. Hoflund, G. B.; Weaver, J. F. Meas. Sci. Technol. 1994, 5, 201.
35. Joshi, A.; Davis, L. E.; Palmberg, P. W. In Methods of Surface Analysis; Czandarna, A. W., Ed.; Elsevier Scientific Publishing Co.: Amsterdam, The Netherlands, 1975; p 160.
36. Gilbert, R. E.; Cox, D. F.; Hoflund, G. B. Rev. Sci. Instrum. 1982, 53, 1281.
37. Savitzky, A.; Golay, M. J. E. Anal. Chem. 1964, 36, 1627.
38. Hoflund, G. B. Depth Profiling. In CRC Handbook of Surface Imaging and Visualization; Hubbard, A. J., Ed.; CRC Press: Boca Raton, FL, 1995; Chapter 6, pp 63-76.
39. High-Resolution XPS of Organic Polymers: The Scienta ESCA300 Database; Beamson, G., Briggs, D., Eds.; Wiley: Chichester, UK, 1992; pp 54 and 226-236.
40. Handbook of X-ray Photoelectron Spectroscopy; Wagner, C. D., Riggs, W. M., Davis, L. E., Moulder, J. F., Muilenberg, G. E., Eds.; Perkin-Elmer Corp.: Eden Prairie, MN, 1979.
41. Hoflund, G. B. In Handbook of Surface and Interface Analysis: Methods in Problem Solving; Rivière, J. C., Myhra, S., Eds.; Marcel Dekker: New York, 1998; pp 57-158.