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Volumn 16, Issue 10, 2005, Pages 2082-2085

Atomic force microscope anodization lithography using pulsed bias voltage synchronized with resonance frequency of cantilever

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; ELECTRIC POTENTIAL; LITHOGRAPHY; NATURAL FREQUENCIES; OXIDES; PULSE MODULATION;

EID: 25444431753     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/10/017     Document Type: Article
Times cited : (19)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.