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Volumn 16, Issue 10, 2005, Pages 2082-2085
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Atomic force microscope anodization lithography using pulsed bias voltage synchronized with resonance frequency of cantilever
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Author keywords
[No Author keywords available]
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Indexed keywords
ASPECT RATIO;
ATOMIC FORCE MICROSCOPY;
CANTILEVER BEAMS;
ELECTRIC POTENTIAL;
LITHOGRAPHY;
NATURAL FREQUENCIES;
OXIDES;
PULSE MODULATION;
APPLIED BIAS VOLTAGE;
ATOMIC FORCE MICROSCOPES;
OXIDE PATTERNS;
PULSE MODULATORS;
ANODIC OXIDATION;
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EID: 25444431753
PISSN: 09574484
EISSN: None
Source Type: Journal
DOI: 10.1088/0957-4484/16/10/017 Document Type: Article |
Times cited : (19)
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References (21)
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