High sensitivity Gas Analysis by mid and near Infrared Diode Lasers

VDI Berichte

Volumn , Issue 1366, 1998, Pages 1-16

  Werle, Peter ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2542606838     PISSN: 00835560     EISSN: None     Source Type: Book Series    
DOI: None     Document Type: Article

References (11)

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2. D.J. BRASSINGTON, in R.E. Hester and R.J. Clark (Eds.), Advances in Spectroscopy Vol. 24 : Spectroscopy in Environmental Science, Wiley, New York 1994.
3. M. TACKE AND R. GRISAR, Laser & Optoelektronik, 27 (1995) 51.
4. R.U. MARTINELLI, Laser Focus World, (March 1996) 77, R.U. MARTINELLI, R.J. MENNA, P.K. YORK, D.Z. GABUZOV, H. LEE, J. ABELES, N.A. MORRIS, J.C. CONOLLY, S.Y. NARAYAN, J.S. VERMAAK, G.H. OLSEN, D.E. COOPER, C.B. CARLISLE, H. RIRIS, in A. Fried (Ed.), Application of Tunable Diode Lasers and other Infrared Sources for Atmospheric Studies and Industrial Monitoring, Proc. SPIE, 2834 (1996) 2.
5. R.U. MARTINELLI, Laser Focus World, (March 1996) 77, R.U. MARTINELLI, R.J. MENNA, P.K. YORK, D.Z. GABUZOV, H. LEE, J. ABELES, N.A. MORRIS, J.C. CONOLLY, S.Y. NARAYAN, J.S. VERMAAK, G.H. OLSEN, D.E. COOPER, C.B. CARLISLE, H. RIRIS, in A. Fried (Ed.), Application of Tunable Diode Lasers and other Infrared Sources for Atmospheric Studies and Industrial Monitoring, Proc. SPIE, 2834 (1996) 2.
6. P. WERLE, F. SLEMR, M. GEHRTZ AND CHR. BRÄUCHLE, Appl. Phys. B 49 (1989) 99, P. WERLE, R. MÜCKE AND F. SLEMR, Appl. Phys. B, 57 (1993) 131, P. WERLE, B. SCHEUMANN, AND J. SCHANDL, Opt. Eng., 33 (1994) 3093, P. WERLE, Appl. Phys. B, 60 (1995) 499, P. WERLE, Spectrochimica Acta A, 52 (1996) 805, and P. WERLE, A Review of Recent Advances in Semiconductor Laser based Gas Monitors, Spectrochimica Acta Reviews, with 183 references (1998) in press.
7. P. WERLE, F. SLEMR, M. GEHRTZ AND CHR. BRÄUCHLE, Appl. Phys. B 49 (1989) 99, P. WERLE, R. MÜCKE AND F. SLEMR, Appl. Phys. B, 57 (1993) 131, P. WERLE, B. SCHEUMANN, AND J. SCHANDL, Opt. Eng., 33 (1994) 3093, P. WERLE, Appl. Phys. B, 60 (1995) 499, P. WERLE, Spectrochimica Acta A, 52 (1996) 805, and P. WERLE, A Review of Recent Advances in Semiconductor Laser based Gas Monitors, Spectrochimica Acta Reviews, with 183 references (1998) in press.
8. P. WERLE, F. SLEMR, M. GEHRTZ AND CHR. BRÄUCHLE, Appl. Phys. B 49 (1989) 99, P. WERLE, R. MÜCKE AND F. SLEMR, Appl. Phys. B, 57 (1993) 131, P. WERLE, B. SCHEUMANN, AND J. SCHANDL, Opt. Eng., 33 (1994) 3093, P. WERLE, Appl. Phys. B, 60 (1995) 499, P. WERLE, Spectrochimica Acta A, 52 (1996) 805, and P. WERLE, A Review of Recent Advances in Semiconductor Laser based Gas Monitors, Spectrochimica Acta Reviews, with 183 references (1998) in press.
9. P. WERLE, F. SLEMR, M. GEHRTZ AND CHR. BRÄUCHLE, Appl. Phys. B 49 (1989) 99, P. WERLE, R. MÜCKE AND F. SLEMR, Appl. Phys. B, 57 (1993) 131, P. WERLE, B. SCHEUMANN, AND J. SCHANDL, Opt. Eng., 33 (1994) 3093, P. WERLE, Appl. Phys. B, 60 (1995) 499, P. WERLE, Spectrochimica Acta A, 52 (1996) 805, and P. WERLE, A Review of Recent Advances in Semiconductor Laser based Gas Monitors, Spectrochimica Acta Reviews, with 183 references (1998) in press.
10. P. WERLE, F. SLEMR, M. GEHRTZ AND CHR. BRÄUCHLE, Appl. Phys. B 49 (1989) 99, P. WERLE, R. MÜCKE AND F. SLEMR, Appl. Phys. B, 57 (1993) 131, P. WERLE, B. SCHEUMANN, AND J. SCHANDL, Opt. Eng., 33 (1994) 3093, P. WERLE, Appl. Phys. B, 60 (1995) 499, P. WERLE, Spectrochimica Acta A, 52 (1996) 805, and P. WERLE, A Review of Recent Advances in Semiconductor Laser based Gas Monitors, Spectrochimica Acta Reviews, with 183 references (1998) in press.
11. P. WERLE, F. SLEMR, M. GEHRTZ AND CHR. BRÄUCHLE, Appl. Phys. B 49 (1989) 99, P. WERLE, R. MÜCKE AND F. SLEMR, Appl. Phys. B, 57 (1993) 131, P. WERLE, B. SCHEUMANN, AND J. SCHANDL, Opt. Eng., 33 (1994) 3093, P. WERLE, Appl. Phys. B, 60 (1995) 499, P. WERLE, Spectrochimica Acta A, 52 (1996) 805, and P. WERLE, A Review of Recent Advances in Semiconductor Laser based Gas Monitors, Spectrochimica Acta Reviews, with 183 references (1998) in press.