Metastable level lifetimes from electron-shelving measurements with ion clouds and single ions

European Physical Journal D

Volumn 29, Issue 2, 2004, Pages 163-171

  Knoop, M ^a   Champenois, C ^a   Hagel, G ^a   Houssin, M ^a   Lisowski, C ^a   Vedel, M ^a   Vedel, F ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DATA FITTING METHOD; DIFFERENT ORIGINS; ELECTRON SHELVING; ERROR BARS; EXPERIMENT DATA; ION CLOUDS; META-STABLE STATE; METASTABLE LEVELS; SINGLE ION; TRAPPED ION;

TRAPPED IONS;

EID: 2542545750     PISSN: 14346060     EISSN: None     Source Type: Journal    
DOI: 10.1140/epjd/e2004-00022-6     Document Type: Article

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