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Volumn 34, Issue 5, 1998, Pages 484-486

Melting Points of Bi12GeO20 and Bi4Ge3O12

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Indexed keywords


EID: 2542510935     PISSN: 00201685     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (12)
  • 4
    • 0000177868 scopus 로고
    • 12 par la méthode Czochralski
    • 12 par la méthode Czochralski, J. Cryst. Growth, 1971, vol. 11, pp. 348-350.
    • (1971) J. Cryst. Growth , vol.11 , pp. 348-350
    • Von Philipsborn, H.1
  • 5
    • 0022960141 scopus 로고
    • The Growth of Multicomponent Oxide Single Crystals by Stepanov's Technique
    • The Growth of Multicomponent Oxide Single Crystals by Stepanov's Technique, J. Cryst. Growth, 1987, vol. 82, no. 1/2, pp. 168-176.
    • (1987) J. Cryst. Growth , vol.82 , Issue.1-2 , pp. 168-176
  • 6
    • 2542588827 scopus 로고
    • 2 (X = Si, Ge, Ti) Systems
    • Moscow: Kurnakov Inst. of General and Inorganic Chemistry, Russian Acad. Sci.
    • 2 (X = Si, Ge, Ti) Systems. Cand. Sci. (Chem.) Dissertation, Moscow: Kurnakov Inst. of General and Inorganic Chemistry, Russian Acad. Sci., 1980.
    • (1980) Cand. Sci. (Chem.) Dissertation
    • Zhereb, V.P.1
  • 8
    • 0023330263 scopus 로고
    • In Situ Microscopy of the Growth of Bismuth Germanate Crystals from High-Temperature Melts
    • Van Enckevort, W.J.P. and Smet, F., In Situ Microscopy of the Growth of Bismuth Germanate Crystals From High-Temperature Melts, J. Cryst. Growth, 1987, vol. 82, no. 4, pp. 678-688.
    • (1987) J. Cryst. Growth , vol.82 , Issue.4 , pp. 678-688
    • Van Enckevort, W.J.P.1    Smet, F.2
  • 10
    • 0000868974 scopus 로고
    • Thermal Analysis of Bismuth Germanate Compounds
    • Corsmit, G., van Driel, M.A., Elsenaar, R.J., et al., Thermal Analysis of Bismuth Germanate Compounds, J. Cryst. Growth, 1986, vol. 75, no. 3, pp. 551-560.
    • (1986) J. Cryst. Growth , vol.75 , Issue.3 , pp. 551-560
    • Corsmit, G.1    Van Driel, M.A.2    Elsenaar, R.J.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.