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Volumn 16, Issue 18, 2004, Pages 3183-3198
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Magnetic ordering in Er3Cu4X4 (X = Si, Ge, Sn)
a b a c |
Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTALLOGRAPHY;
ELECTROMAGNETIC WAVE SCATTERING;
LATTICE CONSTANTS;
MAGNETIZATION;
MAGNETOMETERS;
MOSSBAUER SPECTROSCOPY;
NEUTRON DIFFRACTION;
STOICHIOMETRY;
X RAY DIFFRACTION;
CORRELATION LENGTHS;
MAGNETIC SCATTERING;
ORDERING TEMPERATURES;
PHYSICAL PROPERTIES MEASUREMENT SYSTEM (PPMS);
ERBIUM COMPOUNDS;
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EID: 2542496989
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/16/18/019 Document Type: Article |
Times cited : (22)
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References (24)
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