|
Volumn 59, Issue 1, 2003, Pages 36-42
|
Determination of the crystal structure of the π-AlFeMgSi phase using symmetry- and site-sensitive electron microscope techniques
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ALUMINUM COMPOUNDS;
BEAM PLASMA INTERACTIONS;
BETA RAY SPECTROMETERS;
CRYSTAL ATOMIC STRUCTURE;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPES;
MAGNESIUM COMPOUNDS;
SILICON COMPOUNDS;
CONVERGENT BEAM ELECTRON DIFFRACTION;
ELECTRON CHANNELLING;
ELECTRON MICRO PROBE;
INTERATOMIC DISTANCES;
MICROPROBE ANALYSIS;
CRYSTAL STRUCTURE;
|
EID: 2542484704
PISSN: 01087681
EISSN: None
Source Type: Journal
DOI: 10.1107/S0108768102022887 Document Type: Article |
Times cited : (25)
|
References (12)
|