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Volumn 59, Issue 1, 2003, Pages 36-42

Determination of the crystal structure of the π-AlFeMgSi phase using symmetry- and site-sensitive electron microscope techniques

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COMPOUNDS; BEAM PLASMA INTERACTIONS; BETA RAY SPECTROMETERS; CRYSTAL ATOMIC STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPES; MAGNESIUM COMPOUNDS; SILICON COMPOUNDS;

EID: 2542484704     PISSN: 01087681     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108768102022887     Document Type: Article
Times cited : (25)

References (12)
  • 5
    • 2542417854 scopus 로고
    • edited by S. Amelinckx, R. Gevers, G. Remaut & J. V. Landuyt. Amsterdam: North-Holland
    • Howie, A. (1970). Modern Diffraction and Imaging Techniques in Material Science, edited by S. Amelinckx, R. Gevers, G. Remaut & J. V. Landuyt, pp. 295-306. Amsterdam: North-Holland.
    • (1970) Modern Diffraction and Imaging Techniques in Material Science , pp. 295-306
    • Howie, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.