Correlation between multiple ionization and fragmentation of C60 in 2-MeV Si2+ collisions: Evidence for fragmentation induced by internal excitation

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 69, Issue 3, 2004, Pages

  Majima, T ^a   Nakai, Y ^b   Tsuchida, H ^a   Itoh, A ^a  

^a KYOTO UNIVERSITY   (Japan)

^b RIKEN   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE; ELECTRIC EXCITATION; ELECTRONS; ENERGY DISSIPATION; IONIZATION; KINETIC ENERGY; SILICON; SPECTROMETERS; VIBRATION MEASUREMENT;

ELECTRONIC ENERGY DEPOSITION; MULTIFRAGMENTATION; SLOW HIGHLY CHARGED IONS (SHCI); TIME-OF-FLIGHT (TOF) SPECTROMETERS;

HEAVY IONS;

EID: 2542479219     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevA.69.031202     Document Type: Article

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