High-pressure X-ray near-edge absorption study of thallium rhenium oxide up to 10.86 GPa

High Pressure Research

Volumn 23, Issue 4, 2003, Pages 471-476

  Ablett, J M ^a   Kao, C C ^a   Shieh, S R ^b   Mao, H K ^c   Croft, M ^d   Tyson, T A ^e  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b PRINCETON UNIVERSITY   (United States)

^c GEOPHYSICAL LABORATORY   (United States)

^d RUTGERS UNIVERSITY   (United States)

^e NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Thallium rhenium oxide; X ray absorption

Indexed keywords

ABSORPTION; CHARGE TRANSFER; DIAMONDS; HIGH PRESSURE EFFECTS; OXYGEN; PHASE TRANSITIONS; POSITIVE IONS; X RAY ANALYSIS;

OPTICAL TRANSITIONS; THALLIUM RHENIUM OXIDES; X-RAY ABSORPTION;

THALLIUM COMPOUNDS;

EID: 2542476071     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: 10.1080/08957950310001615839     Document Type: Article

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