InAs/InP quantum-dot pillar microcavities using SiO2/Ta 2O5 Bragg reflectors with emission around 1.55 μm

Applied Physics Letters

Volumn 84, Issue 17, 2004, Pages 3235-3237

  Dalacu, Dan ^a   Poitras, Daniel ^a   Lefebvre, Jacques ^a   Poole, Philip J ^a   Aers, Geof C ^a   Williams, Robin L ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DRY ETCHING; FUNCTIONS; INDUCTIVELY COUPLED PLASMA; ION BEAMS; LIGHT EMISSION; PHOTOLUMINESCENCE; PHOTONS; RANDOM PROCESSES; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM PHOSPHIDE; SILICA; SPUTTERING; TANTALUM COMPOUNDS;

BRAGG REFLECTORS; CAVITY QUALITY; PILLAR MICROCAVITIES; SPACER LAYERS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 2542466940     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1728318     Document Type: Article

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