Infrared optical properties of sol-gel Pb1-xLa xTiO3 ferroelectric thin films

Thin Solid Films

Volumn 458, Issue 1-2, 2004, Pages 223-226

  Shi, F W ^a   Hu, Z G ^a   Wang, G S ^a   Lin, T ^a   Ma, J H ^a   Huang, Z M ^a   Meng, X J ^a   Sun, J L ^a   Chu, J H ^a  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

Author keywords

Ferroelectric thin films; Optical properties; Sol gel; Spectroscopic ellipsometry

Indexed keywords

ELLIPSOMETRY; INFRARED RADIATION; LEAD COMPOUNDS; REFRACTIVE INDEX; SILICON; SOL-GELS; X RAY DIFFRACTION ANALYSIS;

DIELECTRIC FUNCTION MODELS; EXTINCTION COEFFICIENTS; SPECTROSCOPIC ELLIPSOMETRY;

FERROELECTRIC THIN FILMS;

EID: 2542460589     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2003.09.059     Document Type: Article

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