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Crystal Research and Technology

Volumn 39, Issue 4, 2004, Pages 328-332

Effect of substrate temperature on polycrystalline Cd0.9Zn 0.1Te thin films studied by raman scattering spectroscopy

(5) Sridharan, M a Mekaladevi, M b Narayandass, Sa K b Mangalaraj, D b Lee, Hee Chul c

a UNIVERSITAT AUTÒNOMA DE BARCELONA (Spain)

b BHARATHIAR UNIVERSITY (India)

c Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

Author keywords

AFM; Cd0.9Zn0.1Te films; Raman scattering; RBS; Vacuum evaporation; XRD

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; ENERGY GAP; GLASS; MOLECULAR VIBRATIONS; PHONONS; RAMAN SCATTERING; SEMICONDUCTOR MATERIALS; THIN FILMS; VACUUM APPLICATIONS; X RAY DIFFRACTION ANALYSIS;

CD0.9ZN0.1TE FILMS; INFRARED FOCAL PLANE ARRAYS (IRFPA); RBS; VACUUM EVAPORATION;

POLYCRYSTALLINE MATERIALS;

EID: 2542451969 PISSN: 02321300 EISSN: None Source Type: Journal
DOI: 10.1002/crat.200310190 Document Type: Article

Times cited : (19)

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