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Applied Physics Letters

Volumn 84, Issue 18, 2004, Pages 3528-3530

Crossover of thickness dependence of critical current density J c(T,H) in YBa 2Cu 3O 7-δ thick films

(3) Li, Qiang a Suenaga, M a Ye, Z b

a BROOKHAVEN NATIONAL LABORATORY (United States)

b LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRIGHTNESS INTENSITY; FILM THICKNESS EFFECTS; FLUX PINNING STRENGTH; MAGNETO-OPTICAL IMAGING;

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); ELECTRIC CURRENTS; EPITAXIAL GROWTH; MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; MAGNETIZATION; MAGNETOMETERS; PULSED LASER DEPOSITION; SQUIDS; SUPERCONDUCTING FILMS; THERMAL EFFECTS; THICK FILMS;

YTTRIUM BARIUM COPPER OXIDES;

EID: 2542448310 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1737067 Document Type: Article

Times cited : (22)

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