A tribute to the Winnewissers or how science meets technology

Journal of Molecular Structure

Volumn 695-696, Issue , 2004, Pages 379-384

  Keens, Axel ^a  

^a IDS SCHEER AG   (Germany)

Author keywords

High resolution FT spectrometers; Line shape

Indexed keywords

ANALYTIC METHOD; ARTICLE; DEVICE; ENGINEERING; INFRARED SPECTROMETRY; RESEARCH; SCIENCE; SPECTROMETER; TECHNOLOGY;

BRENDA;

EID: 2542438048     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.molstruc.2003.12.040     Document Type: Article

References (8)

1. H. Buijs, Presented at the 1977 International Conference on FT-IR Spectroscopy, Columbia, SC, June 1977, Paper TH.B.8.
2. Murty M.V.R.K. J. Opt. Soc. Am. 50:1960;7
3. Connes J., Connes P. J. Opt. Soc. Am. 56:1966;896
4. Quack M. Chimia. 55:2001;753
5. Chamberlain J. The Principles of Interferometric Spectroscopy. 1979;Wiley, New York. Section 8.2
6. Kauppinen J., Saarinen P. Appl. Opt. 31:1992;69
7. Hase F., Blumenstock T., Paton-Walsh C. Appl. Opt. 38:1999;3417
8. Brault J.W. Appl. Opt. 35:1996;2891