Electronic scattering from Co/Cu interfaces: In situ measurement, comparison with microstructure, and failure of semiclassical free-electron models

Journal of Applied Physics

Volumn 87, Issue 9 II, 2000, Pages 5185-5187

  Bailey, William E ^a   Wang, Shan X ^a   Tsymbal, Evgueni Yu ^b  

^a Stanford University   (United States)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 2542434942     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373289     Document Type: Article

References (12)

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