Optically monitored high-pressure gas loading apparatus for diamond anvil cells

High Pressure Research

Volumn 23, Issue 4, 2003, Pages 409-415

  Couzinet, Bernard ^a   Dahan, Noël ^a   Hamel, Gérard ^a   Chervin, Jean Claude ^a  

^a CNRS   (France)

Author keywords

Diamond anvil cell; Gas loading; High pressure

Indexed keywords

ARGON; COMPACTION; CRACKS; CRYOGENICS; ETHANOL; GAS LOADS; HELIUM; HIGH PRESSURE EFFECTS; METHANOL; NEON;

DIAMOND ANVIL CELLS (DAC); GAS LOADING; HIGH PRESSURE; ROOM TEMPERATURE (RT);

DIAMONDS;

EID: 2542428391     PISSN: 08957959     EISSN: None     Source Type: Journal    
DOI: 10.1080/0895795031000095847     Document Type: Article

References (24)

1. Jayaraman, A. (1983). Review of Modern Physics, 55, 65.
2. Fujishiro, I., Piermarini, G. J., Block, S. and Munro, R. G. (1982). High pressure in research and industry. In: Backman, C. M., Johannisson, T. and Tegner, L. (Eds.), Proceedings of the 8th AIRAPT Conference Uppsala, ISBN, Sweden, Vol. II, p. 608.
3. Ragan, D. D., Clarke, D. R. and Schiferl, D. (1996). Rev. Sci. Instr., 67, 494.
4. Liebenberg, D. H. (1979). Physics Letters, 73, 74.
5. Thomasson, J., Ayache, C., Spain, I. L. and Villedieu, M. (1990). J. Appl. Phys., 68, 5933.
6. Jephcoat, A. P., Mao, H. K. and Bell, P. (1986). J. Geophys. Res., 91, 4677.
7. Burnett, J. H., Cheong, H. M. and Paul, W. (1990). Rev. Sci. Instrum., 61, 3904.
8. For the properties of helium, neon and argon, see for example: Helium: Chang, S.-Y. and Boninsegni, M. (2001). J. Chem. Phys., 115, 2629 and Kortbeek, P. J. and Scheuten, J. A. (1991). J. Chem. Phys., 95, 4519. Neon: Vos, W. L., Scheuten, J. A., Young, D. A. and Ross, M. (1991). J. Chem. Phys., 94, 3835 and Michels, A., Wassenaar, T. and Louwerse, P. (1960). Physica, 539. Argon: Shimizu, H., Tashiro, H., Kume, T. and Sasaki, S. (2001). Phys. Rev. Lett., 86, 4568; Occelli, F., Krisch, M., Loubeyre, P., Sette, F., Le Toullec, R., Masciovecchio, C. and Rueff, J. P. (2001). Phys. Rev. B, 63, 224306 and Zha, C. S., Boehler, R., Young, D. A. and Ross, M. (1986). J. Chem. Phys., 85, 1034.
9. For the properties of helium, neon and argon, see for example: Helium: Chang, S.-Y. and Boninsegni, M. (2001). J. Chem. Phys., 115, 2629 and Kortbeek, P. J. and Scheuten, J. A. (1991). J. Chem. Phys., 95, 4519. Neon: Vos, W. L., Scheuten, J. A., Young, D. A. and Ross, M. (1991). J. Chem. Phys., 94, 3835 and Michels, A., Wassenaar, T. and Louwerse, P. (1960). Physica, 539. Argon: Shimizu, H., Tashiro, H., Kume, T. and Sasaki, S. (2001). Phys. Rev. Lett., 86, 4568; Occelli, F., Krisch, M., Loubeyre, P., Sette, F., Le Toullec, R., Masciovecchio, C. and Rueff, J. P. (2001). Phys. Rev. B, 63, 224306 and Zha, C. S., Boehler, R., Young, D. A. and Ross, M. (1986). J. Chem. Phys., 85, 1034.
10. For the properties of helium, neon and argon, see for example: Helium: Chang, S.-Y. and Boninsegni, M. (2001). J. Chem. Phys., 115, 2629 and Kortbeek, P. J. and Scheuten, J. A. (1991). J. Chem. Phys., 95, 4519. Neon: Vos, W. L., Scheuten, J. A., Young, D. A. and Ross, M. (1991). J. Chem. Phys., 94, 3835 and Michels, A., Wassenaar, T. and Louwerse, P. (1960). Physica, 539. Argon: Shimizu, H., Tashiro, H., Kume, T. and Sasaki, S. (2001). Phys. Rev. Lett., 86, 4568; Occelli, F., Krisch, M., Loubeyre, P., Sette, F., Le Toullec, R., Masciovecchio, C. and Rueff, J. P. (2001). Phys. Rev. B, 63, 224306 and Zha, C. S., Boehler, R., Young, D. A. and Ross, M. (1986). J. Chem. Phys., 85, 1034.
11. For the properties of helium, neon and argon, see for example: Helium: Chang, S.-Y. and Boninsegni, M. (2001). J. Chem. Phys., 115, 2629 and Kortbeek, P. J. and Scheuten, J. A. (1991). J. Chem. Phys., 95, 4519. Neon: Vos, W. L., Scheuten, J. A., Young, D. A. and Ross, M. (1991). J. Chem. Phys., 94, 3835 and Michels, A., Wassenaar, T. and Louwerse, P. (1960). Physica, 539. Argon: Shimizu, H., Tashiro, H., Kume, T. and Sasaki, S. (2001). Phys. Rev. Lett., 86, 4568; Occelli, F., Krisch, M., Loubeyre, P., Sette, F., Le Toullec, R., Masciovecchio, C. and Rueff, J. P. (2001). Phys. Rev. B, 63, 224306 and Zha, C. S., Boehler, R., Young, D. A. and Ross, M. (1986). J. Chem. Phys., 85, 1034.
12. For the properties of helium, neon and argon, see for example: Helium: Chang, S.-Y. and Boninsegni, M. (2001). J. Chem. Phys., 115, 2629 and Kortbeek, P. J. and Scheuten, J. A. (1991). J. Chem. Phys., 95, 4519. Neon: Vos, W. L., Scheuten, J. A., Young, D. A. and Ross, M. (1991). J. Chem. Phys., 94, 3835 and Michels, A., Wassenaar, T. and Louwerse, P. (1960). Physica, 539. Argon: Shimizu, H., Tashiro, H., Kume, T. and Sasaki, S. (2001). Phys. Rev. Lett., 86, 4568; Occelli, F., Krisch, M., Loubeyre, P., Sette, F., Le Toullec, R., Masciovecchio, C. and Rueff, J. P. (2001). Phys. Rev. B, 63, 224306 and Zha, C. S., Boehler, R., Young, D. A. and Ross, M. (1986). J. Chem. Phys., 85, 1034.
13. For the properties of helium, neon and argon, see for example: Helium: Chang, S.-Y. and Boninsegni, M. (2001). J. Chem. Phys., 115, 2629 and Kortbeek, P. J. and Scheuten, J. A. (1991). J. Chem. Phys., 95, 4519. Neon: Vos, W. L., Scheuten, J. A., Young, D. A. and Ross, M. (1991). J. Chem. Phys., 94, 3835 and Michels, A., Wassenaar, T. and Louwerse, P. (1960). Physica, 539. Argon: Shimizu, H., Tashiro, H., Kume, T. and Sasaki, S. (2001). Phys. Rev. Lett., 86, 4568; Occelli, F., Krisch, M., Loubeyre, P., Sette, F., Le Toullec, R., Masciovecchio, C. and Rueff, J. P. (2001). Phys. Rev. B, 63, 224306 and Zha, C. S., Boehler, R., Young, D. A. and Ross, M. (1986). J. Chem. Phys., 85, 1034.
14. For the properties of helium, neon and argon, see for example: Helium: Chang, S.-Y. and Boninsegni, M. (2001). J. Chem. Phys., 115, 2629 and Kortbeek, P. J. and Scheuten, J. A. (1991). J. Chem. Phys., 95, 4519. Neon: Vos, W. L., Scheuten, J. A., Young, D. A. and Ross, M. (1991). J. Chem. Phys., 94, 3835 and Michels, A., Wassenaar, T. and Louwerse, P. (1960). Physica, 539. Argon: Shimizu, H., Tashiro, H., Kume, T. and Sasaki, S. (2001). Phys. Rev. Lett., 86, 4568; Occelli, F., Krisch, M., Loubeyre, P., Sette, F., Le Toullec, R., Masciovecchio, C. and Rueff, J. P. (2001). Phys. Rev. B, 63, 224306 and Zha, C. S., Boehler, R., Young, D. A. and Ross, M. (1986). J. Chem. Phys., 85, 1034.
15. Silvera, I. F. and Wijngaarden, R. J. (1985). Rev. Sci. Instrum., 56, 121.
16. Klotz, S., Schilling, J. S. and Müller, P. (1991). In: Hochheimer, H. D. and Etters, R. D. (Eds.), Frontiers of High Pressure Research. Plenum Press, New York, p. 473.
17. Thomasson, J., Dumont, Y., Griveau, J. C. and Ayache, C. (1997). Rev. Sci. Instrum., 68, 1514.
18. Dahan, N. and Couty, R. (1987). Rev. Sci. Instrum., 58, 412.
19. Mills, R. L., Liebenberg, D. H., Bronson, J. C. and Schmidt, L. C. (1980). Rev. Sci. Instrum., 51, 891.
20. Yagi, T., Yusa, H. and Yamakata, M. (1996). Rev. Sci. Instrum., 67, 2981.
21. Letoullec, R., Pinceaux, J. P. and Loubeyre, P. (1988). High Pressure Research, 1, 77.
22. Bessern, J. M. and Pinceaux, J. P. (1979). Science, 206, 1074.
23. Internal Report, ENS Cachan, Laboratoire de Mécanique et Technologie-Patent n° 91401219.0 (07/05/1991). 'Cellule à enclumes de diamant et son dispositif d'observation et d'analyse d'échantillons à très hautes pressions'.
24. Sherman, W. F. and Stadtmuller, A. A. (1987). In: John Wiley and Sons (Ed.). Experimental Techniques in High Pressure Research.