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Volumn 69, Issue 3, 2004, Pages

Second-order Born model for two-electron atomic ionization by fast charged-particle impact

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; CHARGED PARTICLES; COMPUTATIONAL METHODS; ELECTRON ENERGY LEVELS; HELIUM; IONIZATION; KINEMATICS; MATHEMATICAL MODELS; PERTURBATION TECHNIQUES; PHOTONS;

EID: 2542423080     PISSN: 10502947     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevA.69.032712     Document Type: Article
Times cited : (55)

References (33)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.