MBE growth of high finesse microcavities

Physica Status Solidi (B) Basic Research

Volumn 242, Issue 11, 2005, Pages 2157-2166

  Oesterle, U ^a   Stanley, R P ^b   Houdre R ^c  

^a Swisscom   (United States)

^b CSEM   (Switzerland)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 25144486727     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200560971     Document Type: Article

References (14)

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