Robustness of holographic optical traps against phase scaling errors

Optics Express

Volumn 13, Issue 19, 2005, Pages 7458-7465

  Lee, Sang Hyuk ^a   Grier, David G ^a  

^a POLYTECHNIC UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; HOLOGRAMS; HOLOGRAPHY; OPTICAL DEVICES; PHASE TRANSITIONS;

MODE STRUCTURE; OPTICAL TRAPS; OPTICAL TWEEZERS; TRAP-FORMING HOLOGRAMS;

ROBUSTNESS (CONTROL SYSTEMS);

EID: 25144471227     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OPEX.13.007458     Document Type: Article

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