Optically detected nuclear magnetic resonance at the sub-micron scale

Journal of Magnetic Resonance

Volumn 176, Issue 2, 2005, Pages 207-214

  Meriles, Carlos A ^a  

^a CITY COLLEGE OF NEW YORK   (United States)

Author keywords

Dipolar Field Microscopy; Dipolar fields; Hyperpolarization; Micro tips; NMR microscopy; Optical detection

Indexed keywords

MAGNETIZATION; MICROSCOPIC EXAMINATION; OPTICAL PROPERTIES; OPTICAL RESOLVING POWER; SEMICONDUCTOR MATERIALS;

DIPOLAR FIELD MICROSCOPY; DIPOLAR FIELDS; HYPERPOLARIZATION; MICROTIPS; NMR MICROSCOPY; OPTICAL DETECTION;

NUCLEAR MAGNETIC RESONANCE;

NANOMATERIAL;

ARTICLE; CHEMISTRY; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; NUCLEAR MAGNETIC RESONANCE IMAGING; NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY; OPTICS; PARTICLE SIZE; SCANNING PROBE MICROSCOPY; SEMICONDUCTOR; SYSTEM ANALYSIS; ULTRASTRUCTURE;

IMAGE ENHANCEMENT; MAGNETIC RESONANCE IMAGING; MAGNETIC RESONANCE SPECTROSCOPY; MICROCHEMISTRY; MICROSCOPY, SCANNING PROBE; NANOSTRUCTURES; OPTICS; PARTICLE SIZE; SEMICONDUCTORS; SYSTEMS INTEGRATION;

EID: 25144469480     PISSN: 10907807     EISSN: 10960856     Source Type: Journal    
DOI: 10.1016/j.jmr.2005.05.023     Document Type: Article

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