Tomographic imaging based on scattered radiation from polyethylene using 10, 15, 20, 25 and 30 keV synchrotron X-rays with simple approximations

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 239, Issue 3, 2005, Pages 209-216

  Rao, D V ^a,e   Yuasa, T ^a   Akatsuka, T ^a   Tromba, G ^b   Hasan, M Zahid ^c   Takeda, T ^d  

^a YAMAGATA UNIVERSITY   (Japan)

^b Elettra   (Italy)

^c PRINCETON UNIVERSITY   (United States)

^d UNIVERSITY OF TSUKUBA   (Japan)

^e Sir CRR Institutions   (India)

Author keywords

Compton; Fluorescence photons; Optimum energy; Polyethylene; Rayleigh; Scattered radiation; Simple approximations; Synchrotron X rays; Tomography

Indexed keywords

FLUORESCENCE; IMAGING TECHNIQUES; PHOTONS; SILICON; SYNCHROTRON RADIATION; TOMOGRAPHY; X RAYS;

COMPTON; OPTIMUM ENERGY; RAYLEIGH; SYNCHROTRON X-RAYS;

POLYETHYLENES;

EID: 25144448173     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.05.049     Document Type: Article

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