Weak absorption test and defect analysis of optical coatings

Guangxue Jingmi Gongcheng/Optics and Precision Engineering

Volumn 13, Issue 4, 2005, Pages 430-434

  He, Hong Bo ^a   Li, Xia ^a   Fan, Shu Hai ^a   Zhao, Yuan An ^a   Shao, Jian Da ^a   Fan, Zheng Xiu ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Absorption; Coating defect; Optical coating; Sensitivity; Surface thermal lens

Indexed keywords

CHARACTERIZATION; DEFECTS; HELIUM NEON LASERS; ION BEAM ASSISTED DEPOSITION; LIGHT ABSORPTION; NEODYMIUM LASERS; OPTICAL PUMPING;

COATING DEFECT; ELECTRON BEAM EVAPORATION; ION BEAM SPUTTERING DEPOSITION; SURFACE THERMAL LENSING; WEAK ABSORPTION TEST;

OPTICAL COATINGS;

EID: 25144447794     PISSN: 1004924X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. ISO standard: 11551, 1997, revised 2003, Optics and optical instruments-lasers and laser-related equipment-test method for absorptance of optical laser components[S].
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4. B. CH. LI, S. MARTIN, E. WELSCH. Pulsed top-hat beam thermal-lens measurement for ultraviolet dielectric coatings[J]. Optics Letters, 1999, 24(20): 1398-1400.
5. Z. L. Wu, P. K. Kuo, R. L. Thomas, et al. Absorption measurement of thin films by using photothermal techniques: the influence of thermal properties[J]. SPIE, 1994, 2428: 113.