Interface structure influence on thermal resistance across double-layered nanofilms

Microscale Thermophysical Engineering

Volumn 9, Issue 3, 2005, Pages 295-304

  Liang, Xin Gang ^a   Sun, Lin ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Double layered film; Interface; Molecular dynamics; Nano; Thermal resistance

Indexed keywords

ARGON; THERMAL CONDUCTIVITY; THIN FILMS; VIBRATIONS (MECHANICAL);

DOUBLE-LAYERED FILMS; LENNARD-JONES POTENTIAL; NANO; NON-EQUILIBRIUM MOLECULAR DYNAMICS;

HEAT RESISTANCE;

EID: 25144446282     PISSN: 10893954     EISSN: None     Source Type: Journal    
DOI: 10.1080/10893950500196469     Document Type: Article

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