Texture evolution and microstructure of ECAP Cu determined by XRD and EBSD

Archives of Metallurgy and Materials

Volumn 50, Issue 2, 2005, Pages 435-443

  Schafler, E ^a,b   Tarkowski, L ^c   Bonarski, J ^c   Kopacz, I ^a   Pippan, R ^a,d   Stuwe H P ^a  

^a ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^b UNIVERSITY OF VIENNA   (Austria)

^c INSTITUTE OF METALLURGY AND MATERIALS SCIENCE   (Poland)

^d INSTITUTE FOR MICROELECTRONICS   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 25144438186     PISSN: 08607052     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

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