Phase-field modeling of stress-induced surface instabilities in heteroepitaxial thin films

Journal of Applied Physics

Volumn 98, Issue 4, 2005, Pages

  Seol, D J ^a   Hu, S Y ^a,d   Liu, Z K ^a   Chen, L Q ^a   Kim, S G ^b,c   Oh, K H ^c  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b Kunsan National University   (South Korea)

^c Seoul National University   (South Korea)

^d LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC ENERGY; HETEROEPITAXIAL SYSTEMS; LATTICE MISMATCH; PHASE-FIELD MODEL;

COMPUTER SIMULATION; GERMANIUM COMPOUNDS; INTERFACIAL ENERGY; MATHEMATICAL MODELS; MORPHOLOGY; SURFACES;

THIN FILMS;

EID: 25144431508     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1996856     Document Type: Article

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