EPMA and microstructural characterization of yttrium doped BaTiO3 ceramics

Mikrochimica Acta

Volumn 132, Issue 2-4, 2000, Pages 383-386

  Samardžija, Zoran ^a   Makovec, Darko ^a   Čeh, Miran ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

EPMA; SEM; Yttrium doped BaTiO3

Indexed keywords

EID: 24944574928     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s006040050084     Document Type: Article

References (8)

1. O. Saburi, K. Wakino, IEEE Trans. Component Parts CP-10 1963, p. 53.
2. T. Fukami, H. Tsuchiya, Jap. Journal of Appl. Physics 1979, 18, No. 4, 735.
3. W. P. Rehbach, P. Karduck, Microbeam Anal. In: J. R. Michael, P. Ingram (Eds.) San Francisco Press, San Francisco, 1990, p. 135.
4. J. Labar, C. E. Fiori, R. L. Myklebust, Microbeam Anal. 1993, 2, 169.
5. J. Philibert, Proc. 34th Intl. Symp. X-Ray Optics and X-Ray Microanalysis. Academic Press, Stanford University, New York, 1963, p. 379.
6. P. Duncumb, J. S. B. Reed, The Calculation of Stopping Power and Backscatter Effects in the Electron Probe Microanalysis, Quantitative Electron Probe Microanalysis. In: K. F. J. Heinrich (Ed). NBS Special Publication 298, 1968, p. 133.
7. J. S. B. Reed, Br. J. Appl. Phys. 1965, 16, 913.
8. T. O. Ziebold, Anal. Chem. 1967, 39, 858.