Refrigeration cooled computers: Application and review

ASME International Mechanical Engineering Congress and Exposition, Proceedings (IMECE)

Volumn 2000-AG, Issue , 2000, Pages 277-283

  Schmidt, R R ^a   Ellsworth, M J ^a   Chu, R C ^a   Agonafer, D ^b  

^a IBM   (United States)

^b UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

REFRIGERATION;

COEFFICIENT OF PERFORMANCE; COMPUTER PROCESSORS; CONDITION; CONTINUOUS OPERATION; LOAD COEFFICIENTS; MAINTENANCE SYSTEMS; OPERATION RELIABILITY; PARASITICS; REFRIGERATION COOLING; SYSTEM LEVELS;

THERMAL LOAD;

EID: 24944523522     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2000-2248     Document Type: Conference Paper

References (8)

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2. Gaensslen, F.H., "MOS Devices and Integrated Circuits at Liquid Nitrogen Temperature," 1980 IEEE ICCD Proceedings, ' pp. 450-452,1980.
3. Jaeger, R.C., "Development of Low Temperature CMOS for High Performance Computer Systems," IEEE International Conference on Computer Design: VLSI in Computers," pp. 128-130,1986.
4. Kirschmann, R.K., "Development of Low Tempera-ture | CMOS for High Performance Computer Systems," IEEE International Conference on Computer Design: VLSI in Computers, pp. 128-130,1986.
5. Krane, R.J., Bar-Cohen, A., Jaeger, R.C., and Gaensslen, F.H., "MOS Electronics and Thermal Control for Cryogenically-Cooled Computer Systems," in Advances in Thermal Modeling of Electronic Components and Systems, Vol. 2, ASME Press, New York, NY, pp. 185-232,1990.
6. Needham, W., Prunty, C, and Yeoh, E.H., "High Volume Microprocessor Test Escapes, An Analysis of Defects our Tests are Missing" International Test Conference, 1998.
7. Schwall, R.E. and Harris, W.S., "Packaging and Cooling of Low Temperature Electronics," Advances in Cryogenic Engineering, Plenum Press, NY., pp. 587-596., 1991.
8. Taur, Y. and Nowak, E.J., "CMOS Devices Below 0.1 mm: How High Will Performance Go?", International Symposium on VLSI Technology, Systems, and Applications, pp. 6-9, 1999.