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Volumn 62, Issue 1, 2005, Pages 17-22

A simple derivation of moments of the Exponentiated Weibull distribution

Author keywords

Exponentiated Weibull distribution; Failure rate; Laplace Transform; Moments; Weibull distribution

Indexed keywords


EID: 24944503964     PISSN: 00261335     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001840400351     Document Type: Article
Times cited : (36)

References (7)
  • 1
    • 84947415803 scopus 로고
    • An analysis of some failure data
    • Davis D J (1952) An Analysis of Some Failure Data. JASA, 47:113-150
    • (1952) JASA , vol.47 , pp. 113-150
    • Davis, D.J.1
  • 3
    • 0032676360 scopus 로고
    • The exponentiated weibull family : A graphical approach
    • Jiang R, Murthy DNP (1991) The Exponentiated Weibull Family : A Graphical Approach. IEEE Transactions in Reliability Vol 48(1):68-72
    • (1991) IEEE Transactions in Reliability , vol.48 , Issue.1 , pp. 68-72
    • Jiang, R.1    Murthy, D.N.P.2
  • 5
    • 25844505124 scopus 로고    scopus 로고
    • The Exponentiated weibull family: Some properties and a flood data application
    • Mudholkar GS, Hutson A D (1996) The Exponentiated Weibull Family: Some Properties and a Flood Data Application. Commun Statistics-Theory Method 25(12):3059-3083
    • (1996) Commun Statistics-theory Method , vol.25 , Issue.12 , pp. 3059-3083
    • Mudholkar, G.S.1    Hutson, A.D.2
  • 6
    • 0029404196 scopus 로고
    • The exponentiated weibull family: A reanalysis of the bus motor - Failure data
    • Mudholkar GS, Srivastava DK, Friemer M (1995) The Exponentiated Weibull Family: A Reanalysis of the Bus Motor - Failure Data. Technometrics Vol 37(4):436-445
    • (1995) Technometrics , vol.37 , Issue.4 , pp. 436-445
    • Mudholkar, G.S.1    Srivastava, D.K.2    Friemer, M.3
  • 7
    • 0027608675 scopus 로고
    • The exponentiated weibull family for analysing bathtub failure rate data
    • Mudholkar GS, Srivastava DK (1993) The Exponentiated Weibull Family for Analysing Bathtub Failure Rate Data. IEEE Transactions in Reliability Vol 42:299-302
    • (1993) IEEE Transactions in Reliability , vol.42 , pp. 299-302
    • Mudholkar, G.S.1    Srivastava, D.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.