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Volumn 551, Issue 1, 2005, Pages 145-151

Fast high-resolution characterization of powders using an imaging plate Guinier camera

Author keywords

Guinier camera; Imaging plate; Materials characterization; Standard reference materials; X ray diffractometry

Indexed keywords

CAMERAS; CERAMIC MATERIALS; COPPER; IMAGING TECHNIQUES; MONOCHROMATORS; RADIATION DETECTORS; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

EID: 24944492043     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.07.048     Document Type: Conference Paper
Times cited : (5)

References (12)
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    • Imaging plates for use with synchrotron radiation
    • Y. Amemiya Imaging plates for use with synchrotron radiation J. Synchrotron. Radiat. 2 1995 13
    • (1995) J. Synchrotron. Radiat. , vol.2 , pp. 13
    • Amemiya, Y.1
  • 5
    • 0041681652 scopus 로고    scopus 로고
    • An image plate chamber for X-ray diffraction experiments in Debye-Scherrer geometry
    • O. Stachs, T. Gerber, and V. Petkov An image plate chamber for X-ray diffraction experiments in Debye-Scherrer geometry Rev. Sci. Instrum. 71 2000 4007
    • (2000) Rev. Sci. Instrum. , vol.71 , pp. 4007
    • Stachs, O.1    Gerber, T.2    Petkov, V.3
  • 6
    • 0034480805 scopus 로고    scopus 로고
    • J. the Huber G670 imaging-plate Guinier camera tested on beamline I711 at the MAX II synchrotron
    • K. Ståhl J. The Huber G670 imaging-plate Guinier camera tested on beamline I711 at the MAX II synchrotron J. Appl. Crystallogr. 33 2000 394
    • (2000) J. Appl. Crystallogr. , vol.33 , pp. 394
    • Ståhl, K.1
  • 7
    • 0000089260 scopus 로고
    • DBWS-9411-an upgrade of the DBWS programs for Rietveld Refinement with PC and mainframe computers
    • R.A. Young DBWS-9411-an upgrade of the DBWS programs for Rietveld Refinement with PC and mainframe computers J. Appl. Crystallogr. 28 1995 366
    • (1995) J. Appl. Crystallogr. , vol.28 , pp. 366
    • Young, R.A.1
  • 9
    • 24944519144 scopus 로고    scopus 로고
    • NIST, USA, certificate SRM 660a
    • NIST, USA, certificate SRM 660a
  • 10
    • 24944489091 scopus 로고    scopus 로고
    • NIST, USA, certificate SRM 640c
    • NIST, USA, certificate SRM 640c
  • 11
    • 24944464856 scopus 로고    scopus 로고
    • NIST, USA, certificate SRM 674a
    • NIST, USA, certificate SRM 674a


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.