EXTRACTING LOW ENERGY X-RAY PEAKS FROM EDS AND WDS SPECTRA

Microscopy and Microanalysis

Volumn 4, Issue , 1998, Pages 218-219

  Myklebust, Robert L ^a   Newbury, Dale E ^b  

^a Myklebust Consulting Inc ^*  (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 24944487454     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927600021218     Document Type: Article

References (2)

1. D.E Newbury in X-ray Spectrometry in Electron Beam Instruments, eds. D. Williams et al., New York, Plenum (1995) 167.
2. D.A. Wollman et al., J. Micros. 188 (1998) 196.