Spectral interferences in light element analysis

Mikrochimica Acta

Volumn 132, Issue 2-4, 2000, Pages 153-155

  Buckley, Andy ^a   Reed, Stephen J B ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Interferences; Light elements; Overlaps; Virtual WDS

Indexed keywords

EID: 24944482837     PISSN: 00263672     EISSN: None     Source Type: Journal    
DOI: 10.1007/s006040050056     Document Type: Article

References (3)

1. G. Bastin, H. J. M. Heijligers, X-Ray Spectrometry in Electron Beam Instruments. In: D. B. Williams, J. I. Goldstein, D. E. Newbury (Eds.) Plenum Press, New York, 1995, pp. 239-257.
2. S. J. B. Reed, A. Buckley, Mikrochim. Acta Suppl. 1996, 13, 479.
3. S. J. B. Reed, Mikrochim. Acta Suppl. 1998, 15, 29.