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Volumn 71, Issue 6, 2005, Pages 24-29

Quantitative determination of secondary electrons exit from ferroelectric domains surface

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; FERROELECTRIC MATERIALS; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION; TERBIUM COMPOUNDS;

EID: 24744441883     PISSN: 03214265     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (7)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.